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Energy resolution improvement of a laboratory scale X-ray absorption spectrometer using a position-sensitive detector

Show simple item record 2021-06-18T05:54:10Z 2021-06-18T05:54:10Z 2021-06-18
dc.title Energy resolution improvement of a laboratory scale X-ray absorption spectrometer using a position-sensitive detector en
ethesis.faculty Matemaattis-luonnontieteellinen tiedekunta fi
ethesis.faculty Faculty of Science en
ethesis.faculty Matematisk-naturvetenskapliga fakulteten sv
ethesis.faculty.URI Helsingin yliopisto fi University of Helsinki en Helsingfors universitet sv
dct.creator Zaka, Ayesha
dct.issued 2021
dct.language.ISO639-2 eng
dct.abstract X-ray absorption spectroscopy(XAS) measures the absorption response of the system as a function of incident X-ray photon energy. XAS can be a great tool for material characterization due to its ability to reveal characteristic information specific to chemical state of element by using the core level electrons as a probe for empty electronic states just above the Fermi level of the material (XANES) or for the neighboring atoms (EXAFS). For years, the highly brilliant synchrotron light sources remained the center of attention for these XAS experiments, but the increasing competition for available beamtime at these facilities led to an increased interest in laboratory scale X-ray spectroscopy instruments. However, the energy resolution of laboratory scale instruments still remains sometimes limited as compared to their synchrotron counterparts. When operating at low Bragg angles, the finite source size can greatly reduce the energy resolution by introducing the effects of dispersion in the beam focus at the detector. One method to overcome this loss in resolution can be to use a position sensitive detector and use the 'pixel compensation correction' method in the post-processing of the experimental data. The main focus of this study was to improve the energy resolution of a wavelength dispersive laboratory-scale X-ray absorption spectrometer installed at the University of Helsinki Center for X-ray Spectroscopy. The project focuses on the case of Fe K-absorption edge at 7.112 keV energy and a Bragg angle of 71.74 degrees when using Silicon (5 3 1) monochromator crystal. Our results showed that the data that had been corrected using this method showed sharper spectral features with reduced effects of broadening. Moreover, contribution of other geometrical factors to the energy resolution of this laboratory X-ray spectrometer were also estimated using ray-tracing simulation and an expected improvement in resolution due to pixel compensation correction was calculated. The same technique can be extended to other X-ray absorption edges where a combination of a large deviation of Bragg angle from 90 degrees and a large source size contributes a dominant factor to the energy resolution of the instrument. en
dct.subject X-ray spectroscopy
dct.subject energy resolution
dct.subject position sensitive detection
dct.subject pixel compensation correction
dct.language en
ethesis.isPublicationLicenseAccepted true
ethesis.language englanti fi
ethesis.language English en
ethesis.language engelska sv
ethesis.thesistype pro gradu -tutkielmat fi
ethesis.thesistype master's thesis en
ethesis.thesistype pro gradu-avhandlingar sv
dct.identifier.ethesis E-thesisID:5f4ef5f8-0bf6-41b1-b52d-789992d59d8b
dct.identifier.urn URN:NBN:fi:hulib-202106183110
dc.type.dcmitype Text
ethesis.facultystudyline Kokeellinen materiaalifysiikka fi
ethesis.facultystudyline Experimental Material Physics en
ethesis.facultystudyline Experimentell materialfysik sv
ethesis.mastersdegreeprogram Materiaalitutkimuksen maisteriohjelma fi
ethesis.mastersdegreeprogram Master's Programme in Materials Research en
ethesis.mastersdegreeprogram Magisterprogrammet i materialforskning sv

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