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Molecular dynamics simulation analysis of ion irradiation induced defects in an amorphous silicon dioxide nanowire

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dc.date.accessioned 2016-11-28T08:21:46Z und
dc.date.accessioned 2017-10-24T12:04:17Z
dc.date.available 2016-11-28T08:21:46Z und
dc.date.available 2017-10-24T12:04:17Z
dc.date.issued 2016-11-28T08:21:46Z
dc.identifier.uri http://radr.hulib.helsinki.fi/handle/10138.1/5877 und
dc.identifier.uri http://hdl.handle.net/10138.1/5877
dc.title Molecular dynamics simulation analysis of ion irradiation induced defects in an amorphous silicon dioxide nanowire en
ethesis.department.URI http://data.hulib.helsinki.fi/id/3acb09b1-e6a2-4faa-b677-1a1b03285b66
ethesis.department Institutionen för fysik sv
ethesis.department Department of Physics en
ethesis.department Fysiikan laitos fi
ethesis.faculty Matematisk-naturvetenskapliga fakulteten sv
ethesis.faculty Matemaattis-luonnontieteellinen tiedekunta fi
ethesis.faculty Faculty of Science en
ethesis.faculty.URI http://data.hulib.helsinki.fi/id/8d59209f-6614-4edd-9744-1ebdaf1d13ca
ethesis.university.URI http://data.hulib.helsinki.fi/id/50ae46d8-7ba9-4821-877c-c994c78b0d97
ethesis.university Helsingfors universitet sv
ethesis.university University of Helsinki en
ethesis.university Helsingin yliopisto fi
dct.creator Nourazar, Mehdi
dct.issued 2016
dct.language.ISO639-2 eng
dct.abstract Nanowires made of semiconducting materials are of great relevance and significance in future nanotechnological applications. Irradiation of nanowires is a decisive method used to dope nanowires and tune their structural, mechanical and optical properties. In this study the effects of ion irradiation of an amorphus silicon-dioxide nanowire with a Si core and SiO 2 shell are studied utilizing classical molecular dynamics (MD) simulation. The groundwork is based on the analysis of structural properties and sputtering effects of nanowire or nanorod under irradiation. Here the term nanorod or nanowire refers to any cylindrical shape that has arbitrary length and the cross-sectional diameter ranging from 1 to 100 nanometers. At lengths starting from several times the diameter, it becomes possible to simulate the nanorods and their properties using MD methods. A single argon ion was used for the irradiation process and the properties of the nanowire and sputtering effects were analyzed. The argon ions used for the irradiation process range from 1 to 30 kilo-electron volts (keV). The incident argon atom is irradiated perpendicular to the nanowire surface on both edge and flat surfaces at the given energy range. MD simulation provides the circumstances to simulate and study the sputtering effects of the irradiation process with a resolution in the femtosecond range. This resolution is not possible with current experimental methods and MD simulation is one of the only methods available to study this phenomenon. We performed 200 random individual argon impacts on the nanowire and present the average over all simulation runs. The results obtained show that the highest amounts of defects are produced at the irradiation energy of 10 keV. The defects also appear to be predominantly in the shell region of the nanowire regardless of incident ion energies. en
dct.language en
ethesis.language.URI http://data.hulib.helsinki.fi/id/languages/eng
ethesis.language English en
ethesis.language englanti fi
ethesis.language engelska sv
ethesis.thesistype pro gradu-avhandlingar sv
ethesis.thesistype pro gradu -tutkielmat fi
ethesis.thesistype master's thesis en
ethesis.thesistype.URI http://data.hulib.helsinki.fi/id/thesistypes/mastersthesis
ethesis.degreeprogram Modeling Molecules and Nanosystems (MoMoNano) en
dct.identifier.urn URN:NBN:fi-fe2017112252165
dc.type.dcmitype Text

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