Browsing by Author "Vuori, Mikko"

A method for deriving the complex refractive index of a mm-sized single particle in a specific wavelength using laboratory measurements is presented. Laboratory measurements were done using the 4π scatterometer, which measures Mueller matrix elements of a particle suspended in air using acoustic levitation as a function of scattering angle. To obtain the complex refractive index of the particle, measurements were compared to simulations from a newly developed SIRIS4 Fixed Orientation (SIRIS4 FO) geometric optics simulation. The 4π scatterometer is a unique instrument which measures Mueller matrix elements from a particle using linear polarizers and a detector rotating about the particle on a rotational stage. The scatterometer uses an acoustic levitator as a sample holder which provides nondestructive measurements and full orientation control of the sample. To compare the measurement results to simulations, SIRIS4 single-particle geometric optics code was modified to handle particles in a fixed orientation. The original code is able to calculate the Mueller matrix elements for a given 3D model, but averages the results over the orientation of the particle. The modified SIRIS4 FO calculates the Mueller matrix elements over the full solid angle as functions of the two scattering angles, which give the direction of observation of the scattered wave compared to the direction of the incident wave. A 3D model of the shape of the measured particle was constructed using X-ray microtomography, and was translated to SIRIS4 FO. The complex refractive index was obtained with a nonlinear least squares analysis by minimizing the sum of squared residuals between the measurements and simulations with varying refractive index values. Finally, confidence regions were constrained for the results, by estimating the computed residuals between simulations and measurements as the random errors in the nonlinear model.